NEN EN IEC 61788-15 : 2011
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SUPERCONDUCTIVITY - PART 15: ELECTRONIC CHARACTERISTIC MEASUREMENTS - INTRINSIC SURFACE IMPEDANCE OF SUPERCONDUCTOR FILMS AT MICROWAVE FREQUENCIES
Published date
12-01-2013
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Explains measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 61788-15:2011 | Identical |
| IEC 61788-15:2011 | Identical |
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