NEN EN IEC 62132-3 : 2007
Current
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The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD
Published date
12-01-2013
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Explains a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 62132-3 : 2007 | Identical |
| IEC 62132-3:2007 | Identical |
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