NEN EN IEC 62228-2 : 2017
Current
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
Published date
27-03-2017
Publisher
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Defines test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. Also defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards.
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
EN 62228-2:2017 | Identical |
IEC 62228-2:2016 | Identical |
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