NEN EN IEC 62416 : 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - HOT CARRIER TEST ON MOS TRANSISTORS
Published date
12-01-2013
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Explains the wafer level hot carrier test on NMOS and PMOS transistors.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 62416 : 2010 | Identical |
| IEC 62416:2010 | Identical |
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