NEN EN IEC 62418 : 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - METALLIZATION STRESS VOID TEST
Published date
12-01-2013
Publisher
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Explains a method of metallization stress void test and associated criteria.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 62418:2010 | Identical |
| IEC 62418:2010 | Identical |
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