NEN EN ISO 12179 : 2000 C1 2008
Current
The latest, up-to-date edition.
GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - CALIBRATION OF CONTACT (STYLUS) INSTRUMENTS
12-01-2013
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
5 Measurement standards
6 Contact (stylus) instrument metrological
characteristics
7 Calibration
8 Uncertainty of measurement
9 Contact (stylus) instrument calibration certificate
Annex A (normative) Calibration of instruments measuring
the motifs method parameters
Annex B (normative) Calibration of simplified operator
instruments for the measurement of
surface texture
Annex C (informative) Relation to the GPS matrix model
Bibliography
Applicable to the calibration of the metrological characteristics of contact (stylus) instruments for measuring surface texture using the profile procedure as specified in ISO 3274.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| NS EN ISO 12179 : 2000 AC 2008 | Identical |
| ISO 12179:2000 | Identical |
| UNI EN ISO 12179 : 2001 | Identical |
| BS EN ISO 12179:2001 | Identical |
| ONORM EN ISO 12179 : 2009 | Identical |
| I.S. EN ISO 12179:2000 | Identical |
| NF EN ISO 12179 : 2000 | Identical |
| SN EN ISO 12179 : 2000 CORR 2009 | Identical |
| DIN EN ISO 12179 : 2009-09 | Identical |
| UNE-EN ISO 12179:2001 | Identical |
| DIN EN ISO 12179:2000-11 | Identical |
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