NEN EN ISO 14880-2 : 2007
Current
The latest, up-to-date edition.
OPTICS AND PHOTONICS - MICROLENS ARRAYS - PART 2: TEST METHODS FOR WAVEFRONT ABERRATIONS
12-01-2013
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Apparatus
5.1 General
5.2 Standard optical radiation source
5.3 Standard lens
5.4 Collimator
5.5 Beam reduction optical system
5.6 Aperture stop
6 Test principle
7 Measurement arrangement
7.1 Measurement arrangement for single microlenses
7.2 Measurement arrangement for microlens arrays
7.3 Geometrical alignment of the sample
7.4 Preparation
8 Procedure
9 Evaluation
10 Accuracy
11 Test report
Annex A (normative) Measurement requirements for test
methods for microlenses
Annex B (normative) Microlens test Methods 1 and 2 using
Mach-Zehnder interferometer systems
Annex C (normative) Microlens test Methods 3 and 4 using
a lateral shearing interferometer system
Annex D (normative) Microlens test Method 5 using a
Shack-Hartmann sensor system
Annex E (normative) Microlens array test Method 1 using a
Twyman-Green interferometer system
Annex F (normative) Measurement of uniformity of microlens
array determined by test Method 2
Bibliography
Provides methods for testing wavefront aberrations for microlenses within microlens arrays. Applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
ISO 14880-2:2006 | Identical |
EN ISO 14880-2:2006 | Identical |
UNE-EN ISO 14880-2:2007 | Identical |
BS EN ISO 14880-2:2006 | Identical |
UNI EN ISO 14880-2 : 2007 | Identical |
DIN EN ISO 14880-2:2007-03 | Identical |
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