NEN EN ISO 3274 : 1997
Current
The latest, up-to-date edition.
GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - NOMINAL CHARACTERISTICS OF CONTACT (STYLUS) INSTRUMENTS
12-01-2013
1 Scope
2 Normative references
3 Definitions
4 Nominal values for instrument characteristics
Annexes
A Instruments conforming to ISO 3274:1975
B Background for the improvements introduced in
this International Standard
C Relation to the GPS matrix model
D Bibliography
Specifies profiles and general structure of contact instruments for measurement of surface roughness and waviness, enabling existing international standards to be applied to practical profile evaluating. Defines properties of the instrument which influence profile evaluation and gives basics of the specification of contact instruments (profile meter and profile recorder).
| DevelopmentNote |
Supersedes NEN ISO 3274. (10/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS EN ISO 3274:1998 | Identical |
| UNI EN ISO 3274 : 1998 | Identical |
| UNE-EN ISO 3274:1998 | Identical |
| ISO 3274:1996 | Identical |
| DIN EN ISO 3274:1998-04 | Identical |
| EN ISO 3274:1997 | Identical |
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