NEN EN ISO 9220 : 1994
Current
The latest, up-to-date edition.
METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD
12-01-2013
National foreword
Committees responsible
Method
1. Scope
2. Normative references
3. Definition
4. Principle
5. Instrumentation
6. Factors influencing the measurement results
7. Preparation of cross-sections
8. Calibration of instruments
9. Procedure
10. Measurement uncertainty
11. Expression of results
12. Test report
Annex
A. General guidance on the preparation and
measurement of cross-sections
Uses scanning electron microscope to examine cross sections of metallic coatings to measure thickness.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN ISO 9220:1995 | Identical |
| ISO 9220:1988 | Identical |
| BS EN ISO 9220:1995 | Identical |
| EN ISO 9220:1994 | Identical |
| DIN EN ISO 9220:1995-01 | Identical |
| UNE-EN ISO 9220:1996 | Identical |
| UNI EN ISO 9220 : 1998 | Identical |
| NF EN ISO 9220 : 1995 | Identical |
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