NEN EN ISO/IEC 15416 : 2002

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
  4.1 Abbreviations
  4.2 Symbols
5 Measurement methodology
  5.1 General requirements
  5.2 Reference reflectivity measurements
      5.2.1 Measurement wavelength(s)
      5.2.2 Measuring aperture
      5.2.3 Optical geometry
      5.2.4 Inspection band
      5.2.5 Number of scans
  5.3 Scan reflectance profile
  5.4 Scan reflectance profile assessment parameters
      5.4.1 Element determination
      5.4.2 Edge determination
      5.4.3 Decode
      5.4.4 Symbol contrast (SC)
      5.4.5 Minimum reflectance (R[min])
      5.4.6 Edge contrast (EC)
      5.4.7 Modulation (MOD)
      5.4.8 Defects
      5.4.9 Decodeability
      5.4.10 Quiet zone check
6 Symbol grading
  6.1 Scan reflectance profile grading
      6.1.1 Decode
      6.1.2 Reflectance parameter grading
      6.1.3 Decodeability
  6.2 Expression of symbol grade
7 Substrate characteristics
Annex A (normative) Decodeability
      A.1 - Two-width symbologies
      A.2 - Edge to similar edge decodable symbologies
            ((n, k) symbologies)
Annex B (normative) Example of symbol quality grading
      B.1 - Individual scan reflectance profile grading
      B.2 - Overall symbol grade
Annex C (informative) Symbol grading flowchart
Annex D (informative) Substrate characteristics
      D.1 - Substrate opacity
      D.2 - Gloss
      D.3 - Over-laminate
      D.4 - Static reflectance measurement
            D.4.1 - Prediction of Symbol Contrast (SC)
            D.4.2 - Prediction of Minimum Edge Contrast
                    (EC[min]) and Modulation (MOD)
            D.4.3 - Acceptability of measured and
                    derived values
Annex E (informative) Interpretation of the scan
                      reflectance profile and profile
                      grades
      E.1 - Significance of scan reflectance profiles
      E.2 - Interpretation of results
      E.3 - Matching grades to applications
      E.4 - Alphabetic grading
Annex F (informative) Guidance on selection of light
                      wavelength
      F.1 - Light source
      F.2 - Effect of variations in wavelength
Annex G (informative) Guidance on number of scans per
                      symbol
Annex H (informative) Example of verification report
Annex I (informative) Comparison with traditional
                      methodologies
      I.1 - Traditional methodologies
      I.2 - Correlation of Print Contrast Signal with
            symbol contrast measurements
      I.3 - Guidance on grading for applications also
            specifying PCS
Annex J (informative) Process control requirements
      J.1 - Process control for repetitive printing
      J.2 - Number of scans
      J.3 - Bar width deviation
            J.3.1 - Two-width symbologies
            J.3.2 - (n, k) symbologies
            J.3.3 - Average bar width gain/loss
Bibliography

Defines the methodology for the measurement of specific attributes of bar code symbols; specifies a method to evaluate these measurements and derive an overall assessment of symbol quality; and establishes possible causes of deviation from optimum grades to assist users in taking appropriate corrective action. Applies to symbologies for which a reference decode algorithm has been defined, and which are intended to be read using linear scanning methods, but its methodology can be partially or wholly applied to other symbologies.