NEN IEC 60748-4-3 : 2006
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 4-3: INTERFACE INTEGRATED CIRCUITS - DYNAMIC CRITERIA FOR ANALOGUE-DIGITAL CONVERTERS (ADC)
Published date
12-01-2013
Publisher
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Defines a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60748-4-3:2006 | Identical |
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