NEN IEC 61163-2 : 1998
Current
Current
The latest, up-to-date edition.
RELIABILITY STRESS SCREENING - PART 2: ELECTRONIC COMPONENTS
Published date
12-01-2013
Publisher
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Provides guidance on reliability stress screening techniques and procedures for electronic components.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| SupersededBy |
| Standards | Relationship |
| IEC 61163-2:1998 | Identical |
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