NEN-IEC 62047-31:2019
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Available format(s)
Hardcopy
Language(s)
English
Published date
01-04-2019
Publisher
€77.16
Excluding VAT
NEN-IEC 62047-31 specifies a four-point bending test method for measuring interfacial adhesion energy of the weakest interface in the layered micro-electromechanical systems (MEMS) based on the concept of fracture mechanics.
| DocumentType |
Standard
|
| ISBN |
9782832267172
|
| Pages |
0
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-31:2019 | Identical |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.