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NEN IEC 62396-2 : 2012

Current

Current

The latest, up-to-date edition.

PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS

Published date

23-11-2012

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Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons.

DevelopmentNote
Supersedes NEN NPR IEC/TS 62396-2. (11/2012)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

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