NEN IEC 62396-2 : 2012
Current
Current
The latest, up-to-date edition.
PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
Published date
23-11-2012
Publisher
Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons.
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.