NEN IEC 62396-2 : 2012
Current
Current
The latest, up-to-date edition.
PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
Published date
23-11-2012
Publisher
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Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons.
| DevelopmentNote |
Supersedes NEN NPR IEC/TS 62396-2. (11/2012)
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| DocumentType |
Standard
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| PublisherName |
Netherlands Standards
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| Status |
Current
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| Supersedes |
Summarise
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