NEN IEC 62527 : 2007
Current
Current
The latest, up-to-date edition.
STANDARD FOR EXTENSIONS TO STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DC LEVEL SPECIFICATION
Published date
12-01-2013
Publisher
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Defines the structures in STIL for specifying the DC conditions for a DUT. Examples of the DC conditions for device power supplies are DSP setup, power sequencing to the device, and power supply limiting/clamping.
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
IEC 62527:2007 | Identical |
IEEE 1450.2 : 2007 | Identical |
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