NEN IEC 62528 : 2007
Current
Current
The latest, up-to-date edition.
STANDARD TESTABILITY METHOD FOR EMBEDDED CORE-BASED INTEGRATED CIRCUITS
Published date
12-01-2013
Publisher
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Defines a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores.
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
IEC 62528:2007 | Identical |
IEEE 1500:2007 | Identical |
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