NEN IEC 62860 : 2013
Current
Current
The latest, up-to-date edition.
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
Published date
05-09-2013
Publisher
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Explains a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62860:2013 | Identical |
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