![header thumbnail](/images/publishers\nen_cover.gif)
NEN IEC 62860 : 2013
Current
Current
The latest, up-to-date edition.
![header thumbnail](/images/publishers\nen_cover.gif)
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
Published date
05-09-2013
Publisher
Explains a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.