NEN-ISO 13084:2018
Current
Current
The latest, up-to-date edition.
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Available format(s)
Hardcopy
Language(s)
English
Published date
12-12-2018
Publisher
€79.70
Excluding VAT
This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes.
| Committee |
TC 201
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 13084:2018 | Identical |
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