NEN ISO 16243 : 2011
Current
Current
The latest, up-to-date edition.
SURFACE CHEMICAL ANALYSIS - RECORDING AND REPORTING DATA IN X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
Published date
12-01-2013
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Defines the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). Also provides information that is to be recorded on or in the analytical record.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 16243:2011 | Identical |
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