NEN ISO 17901-2 : 2015
Current
Current
The latest, up-to-date edition.
OPTICS AND PHOTONICS - HOLOGRAPHY - PART 2: METHODS FOR MEASUREMENT OF HOLOGRAM RECORDING CHARACTERISTICS
Published date
12-08-2015
Publisher
Sorry this product is not available in your region.
Defines the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 17901-2:2015 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.