NEN ISO 17901-2 : 2015
Current
Current
The latest, up-to-date edition.
OPTICS AND PHOTONICS - HOLOGRAPHY - PART 2: METHODS FOR MEASUREMENT OF HOLOGRAM RECORDING CHARACTERISTICS
Published date
12-08-2015
Publisher
Defines the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference.
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