NEN ISO 18114 : 2003
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SURFACE CHEMICAL ANALYSIS - SECONDARY-ION MASS SPECTROMETRY - DETERMINATION OF RELATIVE SENSITIVITY FACTORS FROM ION-IMPLANTED REFERENCE MATERIALS
Published date
12-01-2013
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Defines a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials. Applies to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 18114:2003 | Identical |
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