NEN ISO 19318 : 2004
Current
Current
The latest, up-to-date edition.
SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - REPORTING OF METHODS USED FOR CHARGE CONTROL AND CHARGE CORRECTION
Published date
12-01-2013
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Defines the minimum amount of information describing the methods of charge control and charge correction in measurements of core-level binding energies for insulating specimens by X-ray photoelectron spectroscopy that shall be reported with the analytical results.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 19318:2004 | Identical |
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