NEN ISO 22489 : 2016
Current
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - QUANTITATIVE POINT ANALYSIS FOR BULK SPECIMENS USING WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPY
Published date
12-01-2013
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Defines requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 22489:2016 | Identical |
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