NEN ISO 22489 : 2016
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The latest, up-to-date edition.
MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - QUANTITATIVE POINT ANALYSIS FOR BULK SPECIMENS USING WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPY
Published date
12-01-2013
Publisher
Defines requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
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