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NEN ISO 29301 : 2018

Current

Current

The latest, up-to-date edition.

MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHODS FOR CALIBRATING IMAGE MAGNIFICATION BY USING REFERENCE MATERIALS WITH PERIODIC STRUCTURES

Published date

31-10-2018

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Defines a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM).

Committee
TC 202
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
ISO 29301:2010 Identical

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