NEN NPR IEC/PAS 62189 : 2001
Current
Current
The latest, up-to-date edition.
Performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time.
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
IEC PAS 62189:2000 | Identical |
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