NEN NPR IEC/PAS 62189 : 2001
Current
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Summarise this standard
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Performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC PAS 62189:2000 | Identical |
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