NEN NPR IEC/PAS 62206 : 2001
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Intends to simulate worst case conditions encountered in typical applications. The power and temperature cycling test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC PAS 62206:2000 | Identical |
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