NEN NPR IEC/TR 62433-2-1 : 2010
Current
Current
The latest, up-to-date edition.
EMC IC MODELLING - PART 2-1: THEORY OF BLACK BOX MODELLING FOR CONDUCTED EMISSION
Published date
12-01-2013
Publisher
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Defines black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC TR 62433-2-1:2010 | Identical |
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