NEN NPR IEC/TS 61945 : 2000
Current
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MANUFACTURING LINE APPROVAL - METHODOLOGY FOR TECHNOLOGY AND FAILURE ANALYSIS
Published date
12-01-2013
Publisher
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Describes the methodology for technology and failure analysis in manufacturing integrated circuits.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC TS 61945:2000 | Identical |
Summarise
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