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NEN NPR IEC/TS 61945 : 2000

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MANUFACTURING LINE APPROVAL - METHODOLOGY FOR TECHNOLOGY AND FAILURE ANALYSIS

Published date

12-01-2013

Describes the methodology for technology and failure analysis in manufacturing integrated circuits.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC TS 61945:2000 Identical

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