NEN NPR IEC/TS 62132-9 : 2014
Current
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD
Published date
20-10-2014
Publisher
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Defines a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC).
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC TS 62132-9:2014 | Identical |
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