NEN NPR IEC/TS 62878-2-4 : 2015
Current
Current
The latest, up-to-date edition.
DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)
Published date
26-05-2015
Publisher
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Explains the test element group devices useful when measuring basic properties of device embedded substrates.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC TS 62878-2-4:2015 | Identical |
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