NEN NPR ISO/TS 24597 : 2011
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MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS
Published date
12-01-2013
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Defines methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a contrast-to-gradient (CG) method and a derivative (DR) method.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
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| Status |
Current
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| Standards | Relationship |
| ISO/TS 24597:2011 | Identical |
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