NF EN 12698-2 : 2008
Current
The latest, up-to-date edition.
CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 2: XRD METHODS
12-01-2013
Avant-propos
1 Domaine d'application
2 Références normatives
3 Termes et définitions
4 Appareillage
5 Échantillonnage
6 Mode opératoire
6.1 Préparation des échantillons
6.2 Paramètres de mesure
6.3 Analyse qualitative
6.4 Analyse quantitative
7 Fidélité
7.1 Répétabilité
7.2 Reproductibilité
8 Rapport d'essai
Annexe A (normative) Données de diffraction des rayons X
pour la détermination de la teneur en SiAION-v'
Bibliographie
Specifies methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
| DevelopmentNote |
Indice de classement: B49-422-2. (04/2008) Supersedes NF EN 12698. (09/2012)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| UNE-EN 12698-2:2007 | Identical |
| UNI EN 12698-2 : 2007 | Identical |
| EN 12698-2:2007 | Identical |
| BS EN 12698-2:2007 | Identical |
| DIN EN 12698-2:2007-06 | Identical |
| NF EN ISO 21068-1 : 2008 | CHEMICAL ANALYSIS OF SILICON CARBIDE- CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 1: GENERAL INFORMATION AND SAMPLE PREPARATION |
| NF EN 12698-1 : 2008 | CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 1: CHEMICAL METHODS |
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