NF EN 60444-2 : 2001
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS
12-01-2013
Avant-propos
1 Domaine d'application
2 Principe de mesure
3 Circuit de mesure
4 Méthode de mesure
5 Erreurs de mesure
6 Autres méthodes de mesure
Annexe A
Annexe ZA (normative) Références normatives à
d'autres publications
internationales avec les
publications européennes
correspondantes
Gives a method for measurement of the motional capacitance of quartz crystal in the frequency range 1 MHz with a total measurement error of the order of 5%.
| DevelopmentNote |
Indice de classement: C93-622. (09/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60444-2:1997 | Identical |
| EN 60444-2:1997 | Identical |
| IEC 60444-2:1980 | Identical |
| DIN EN 60444-2:1997-10 | Identical |
| I.S. EN 60444-2:1999 | Identical |
| NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
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