NF EN 60738-1 : 2006 AMD 1 2014

1 Scope
2 Normative references
3 Terms and definitions
4 Units and symbols
5 Preferred values
  5.1 Climatic categories
  5.2 Marking
  5.3 Spacings
6 Quality assessment procedures
  6.1 General
  6.2 Primary stage of manufacture
  6.3 Subcontracting
  6.4 Structurally similar components
  6.5 Qualification approval procedures
  6.6 Rework and repair
  6.7 Release for delivery
  6.8 Certified test records of released lots
  6.9 Delayed delivery
  6.10 Alternative test methods
  6.11 Manufacture outside the geographical limits of
       IECQ NSIs
  6.12 Unchecked parameters
7 Test and measurement procedures
  7.1 General
  7.2 Standard conditions for testing
  7.3 Drying and recovery
  7.4 Visual examination and check of dimensions
  7.5 Zero-power resistance
  7.6 Temperature coefficient of resistance
  7.7 Insulation resistance (for insulated types only)
  7.8 Voltage proof (for insulated types only)
  7.9 Resistance/temperature characteristic
  7.10 Dissipation factor at U[max] (delta)
  7.11 Response time by ambient temperature change
       (t[a])
  7.12 Response time by power change (t[p])
  7.13 Thermal time constant by ambient temperature change
       (tau[a])
  7.14 Thermal time constant by cooling (tau[c])
  7.15 Robustness of terminations
  7.16 Solderability
  7.17 Resistance to soldering heat
  7.18 Rapid change of temperature
  7.19 Vibration
  7.20 Bump
  7.21 Shock
  7.22 Climatic sequence
  7.23 Damp heat, steady state
  7.24 Endurance
  7.25 Tripping current and tripping time
  7.26 Non-tripping current
  7.27 Residual current
  7.28 Surface temperature
  7.29 Inrush current
  7.30 Mounting (for surface mount thermistors only)
  7.31 Shear (adhesion) test
  7.32 Substrate bending test
Annex A (normative) Interpretation of sampling plans
         and procedures as described in IEC 60410
         for use within the IEC quality assessment system
         for electronic components (IECQ)
Annex B (informative) Mounting for electrical measurements
         (except surface mount types)
Annex C (informative) Mounting for temperature measurements
Annex ZA (normative) Normative references to international
         publications with there corresponding European
         publications

Defines terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types, typically made from ferro-electric semi-conductor materials. Addresses standard terms, inspection procedures and methods of test used in detail specifications for Qualification Approval and Quality Assessment Systems for electronic components.