NF EN 60749-29 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
| DevelopmentNote |
Indice de classement: C96-022-29. (05/2004) PR NF EN 60749-29 March 2011. (03/2011)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-29:2012-01 | Identical |
| IEC 60749-29:2011 | Identical |
| I.S. EN 60749-29:2011 | Identical |
| EN 60749-29:2011 | Identical |
| BS EN 60749-29:2011 | Identical |
| UNE-EN 60749-29:2004 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.