NF EN 60749-34 : 2011
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
12-01-2013
FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Test conditions
7 Precautions
8 Measurements
9 Failure criteria
10 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors.
| DevelopmentNote |
Indice de classement: C96-022-34. PR NF EN 60749-34 March 2003. (03/2003) PR NF EN 60749-34 October 2010. (10/2010)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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| Standards | Relationship |
| DIN EN 60749-34:2011-05 | Identical |
| UNE-EN 60749-34:2011 | Identical |
| EN 60749-34:2010 | Identical |
| BS EN 60749-34:2010 | Identical |
| IEC 60749-34:2010 | Identical |
| I.S. EN 60749-34:2010 | Identical |
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