NF EN 60749-34 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Test conditions
7 Precautions
8 Measurements
9 Failure criteria
10 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors.
| DevelopmentNote |
Indice de classement: C96-022-34. PR NF EN 60749-34 March 2003. (03/2003) PR NF EN 60749-34 October 2010. (10/2010)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-34:2011-05 | Identical |
| EN 60749-34:2010 | Identical |
| BS EN 60749-34:2010 | Identical |
| IEC 60749-34:2010 | Identical |
| UNE-EN 60749-34:2011 | Identical |
| I.S. EN 60749-34:2010 | Identical |
Summarise
Sorry this product is not available in your region.