NF EN 60749-4 : 2002

Withdrawn

Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)

Available format(s):

Withdrawn date: 29-09-2021

Language(s):

Published date: 12-01-2013

Publisher: Association Francaise de Normalisation

Table of Contents - (Show below) - (Hide below)

Foreword
1 Scope
2 HAST test - General remarks
3 Test apparatus
4 Test conditions
5 Procedure
6 Failure criteria
7 Safety
8 Summary
Bibliography

Abstract - (Show below) - (Hide below)

Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

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Development Note	Indice de classement: C96-022-4. (03/2003) Supersedes NF EN 60749. (06/2007)
Document Type	Standard
ISBN
Pages
Published
Publisher	Association Francaise de Normalisation
Status	Withdrawn
Superseded By	NF EN 60749-4:2017

International Equivalents – Equivalent Standard(s) & Relationship - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
UNE-EN 60749-4:2003	Identical
NBN EN 60749-4 : 2003	Identical
I.S. EN 60749-4:2017	Identical
BS EN 60749-4:2002	Identical
IEC 60749-4:2017	Identical
EN 60749-4:2017	Identical
DIN EN 60749-4:2016-06 (Draft)	Identical
BS EN 60749-4:2017	Identical

Standards Referenced By This Book - (Show below) - (Hide below)

NF EN 60749-30 : 2005 AMD 1 2011	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
NF EN 60749-5 : 2003	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

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