NF EN 60749-9:2017
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
Hardcopy
English - French
01-06-2017
Important note : Users cannot be edited or removed once added to your Multi user PDF.The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
12
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-9:2017 | Identical |
| EN 60749-9:2017 | Identical |
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