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NF EN 62047-17 : 2015

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 17: BULGE TEST METHOD FOR MEASURING MECHANICAL PROPERTIES OF THIN FILMS

Published date

29-01-2014

DevelopmentNote
Indice de classement: C96-050-17. PR NF EN 62047-17 January 2014. (01/2014)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
IEC 62047-17:2015 Identical
EN 62047-17:2015 Identical

IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials

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