NF EN IEC 60749-28:2022
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-04-2022
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.This part ofIEC 60749establishes theprocedurefor testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-inducedchargeddevice model (CDM) electrostatic discharge (ESD).
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
53
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-28:2022 | Identical |
| EN IEC 60749-28:2022 | Identical |
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