NF EN IEC 60749-28:2022
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Published date
01-04-2022
Publisher
Sorry this product is not available in your region.
Summarise this standard
AI-generated summary
This part ofIEC 60749establishes theprocedurefor testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-inducedchargeddevice model (CDM) electrostatic discharge (ESD).
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-28:2022 | Identical |
| EN IEC 60749-28:2022 | Identical |
Sorry this product is not available in your region.