NF EN IEC 60749-28:2022
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-04-2022
Publisher
This part ofIEC 60749establishes theprocedurefor testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-inducedchargeddevice model (CDM) electrostatic discharge (ESD).
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