NF EN IEC 60749-41:2020
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
Published date
01-09-2020
Publisher
Sorry this product is not available in your region.
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-41:2020 | Identical |
| IEC 60749-41:2020 | Identical |
Summarise
Sorry this product is not available in your region.