Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4 : evaluation method of data interface for automotive vehicle sensors

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Hardcopy

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English - French

Published date

01-08-2018

Publisher

Association Francaise de Normalisation

1 Domaine d'application 2 Références normatives 3 Termes, définitions et termes abrégés 4 Evaluation et essais 5 Paramètres de l'essai de perturbation Annexe A (informative) Description détaillée des éléments perturbateurs Bibliographie

This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

DocumentType	Standard
Pages	0
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
EN IEC 62969-4:2018	Identical
IEC 62969-4:2018	Identical

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NF EN IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4 : evaluation method of data interface for automotive vehicle sensors

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Abstract

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