NF ISO 14237 : 2010
Current
Current
The latest, up-to-date edition.
SURFACE CHEMICAL ANALYSIS - SECONDARY-ION MASS SPECTROMETRY - DETERMINATION OF BORON ATOMIC CONCENTRATION IN SILICON USING UNIFORMLY DOPED MATERIALS
Published date
12-01-2013
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DevelopmentNote |
Indice de classement: X21-070. PR NF ISO 14237 September 2009. (09/2009)
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DocumentType |
Standard
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PublisherName |
Association Francaise de Normalisation
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Status |
Current
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Standards | Relationship |
ISO 14237:2010 | Identical |
ISO 18114:2003 | Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials |
ISO 17560:2014 | Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of boron in silicon |
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