Relates to immunity of industrial process measurement and control instrumentation to repetitive electrical fast transient. Additionally establishes severity levels and test procedures. Establishes a common and reproducible basis for evaluating the performance of electronic instrumentation when this is subjected to repetitive fast transients (bursts), on either supply, signal or control lines, The test is intended to demonstrate the EMI of the instrumentation when subjected to types of transient interference such as that originating from switching transients (interruption of inductive loads, relay contact bounce, etc.).