NS EN ISO 5436-1 : 1ED 2000

1 Scope
2 Normative references
3 Terms and definitions
4 Design requirements
    4.1 Material
    4.2 Size of measurement standard
5 Types, purposes and metrological characteristics of
    measurement standards
    5.1 General
    5.2 Type A - Depth measurement standard
    5.3 Type B - Tip condition measurement standard
    5.4 Type C - Spacing measurement standard
    5.5 Type D - Roughness measurement standard
    5.6 Type E - Profile co-ordinate measurement standard
6 Measurement standard requirements
    6.1 Type A - Depth measurement standard
    6.2 Type B - Tip condition measurement standard
    6.3 Type C - Spacing measurement standard
    6.4 Type D - Roughness measurement standard
    6.5 Type E - Profile co-ordinate measurement standard
7 Definition of the measurements for the measurement
    standards
    7.1 Type A1
    7.2 Type A2 0025
    7.3 Type B2
    7.4 Type B3
    7.5 Types C1 to C4, and D
    7.6 Type E1
    7.7 Type E2
8 Measurement standard certificate
Annex A (informative) Relation to the GPS matrix model
Bibliography

Defines the characteristics of material measures which are used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for measuring surface texture by the profile method defined in ISO 3274.