OIML R 98 : 1991
Current
Current
The latest, up-to-date edition.
HIGH-PRECISION LINE MEASURES OF LENGTH
Published date
12-01-2013
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FOREWORD
1 General
2 Terminology
3 General technical requirements
4 Metrological requirements
5 Verification
6 Metrological controls
7 Packing
Pertains to rigid line measures of length of high precision, either single-valued or multiple-valued, on bars of metal or glass.
| DocumentType |
Standard
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| PublisherName |
Organisation Internationale de Metrologie Legale
|
| Status |
Current
|
| PD IEC/TS 62622:2012 | Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings |
| IEC TS 62622:2012 | Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings |
Summarise
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